• Continuous optimisation thanks to decades of experience
• Development and production in Berlin
• Compared to a conventional pinhole collimator: amplification of the XRF density by up to 10,000-fold
• Shortening of measurement time by concentrating the excitation beam on a small spot at very high intensity
• Small spot sizes of up to < 10*  µm for measurements on smallest components and microstructures
• Spectral bandwidth from 1 keV - 50keV
• Different types available: Monocapillaries with cylindrical, elliptical, or parabolic shape, and a variety of polycapillaries incl. halo-free versions
• In-house developed software WinFTM supports mapping functions, special evaluations like array mode and automated measurements

* Spot size at Mo-K

Measurement of thin and very thin coatings and analysis of complex multilayer systems:

• Coatings on silicon wafers and PCBs
• Measurement of Ag content in solder bumps
• SMD components
• Plug-in contacts
• Leadframes
• Microscale element and layer thickness mappings

The development and manufacture of high-precision capillary optics for X-ray beam shaping is one of our core technological competences. Thanks to these components, Helmut Fischer's XRF instruments are able to measure on the smallest components and microstructures. As one of only 2 manufacturers worldwide, we ensure innovation and the highest measurement precision.